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Ronald D. Schrimpf : ウィキペディア英語版 | Ronald D. Schrimpf
Ronald D Schrimpf is an American electrical engineer and scientist. He is the Orrin H. Ingram Chair in Engineering, Electrical Engineering & Computer Science at Vanderbilt University.〔http://engineering.vanderbilt.edu/bio/ronald-schrimpf〕 where his research activities focus on microelectronics and semiconductor devices. He is affiliated with the Radiation Effects and Reliability Group at Vanderbilt University where he works on the effects of radiation on semiconductor devices and integrated circuits. He also serves as the Director of the Institute for Space and Defense Electronics at Vanderbilt. He is best known for his work in the field of ionizing radiation response on Bipolar junction transistor (BJT) and Enhanced Low Dose Rate Sensitivity in BJT. == Early life and education ==
Ron Schrimpf was born on 18 August 1959 in Lake City, Minnesota. He graduated from Lincoln Secondary School, Wabasha county, Lake City in 1977 and went on to join the University of Minnesota as an undergraduate student in the Department of Electrical Engineering. He graduated from University of Minnesota with a PhD in 1986.
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